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Course Criteria
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3.00 Credits
Review of the first, second, and third laws of thermodynamics and their consequences. Stability criteria, simultaneous chemical reactions, binary and multi-component solutions, phase diagrams, surfaces, adsorption phenomena.
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3.00 Credits
Introduction to transmission electron microscopy-theoretical background and practical work. Lectures and laboratory experiments cover the technical construction and operation of transmission electron microscopes, specimen preparation, electron diffraction by crystals, electron diffraction techniques of TEM, conventional TEM imaging, and scanning TEM. Examples from various fields of materials research illustrate the application and significance of these techniques. Recommended preparation: Consent of instructor.
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3.00 Credits
Methods and procedures for determining the basic causes of failures in structures and components. Recognition of fractures and excessive deformations in terms of their nature and origin. Development and full characterization of fractures. Legal, ethical, and professional aspects of failures from service. Recommended preparation: EMSE 201 and EMSE 303 and ENGR 200; or consent.
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3.00 Credits
Theory and laboratory experiments to learn advanced techniques of transmission electron microscopy, including high-resolution transmission electron microscopy (HRTEM), convergent-beam electron diffraction (CBED), microanalysis using X-ray energy-dispersive spectroscopy (XEDS) and electron energy-loss spectroscopy (EELS), and electron-spectroscopic imaging (ESI) for elemental mapping. Recommended preparation: EMSE 509.
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3.00 Credits
Presentation of the main crystallographic defects in semiconductors; point defects (e.g., vacancies, interstitials, substitutional and interstitial impurities), line defects (e.g., dislocations), planar defects (e.g., grain boundaries). Structural, electrical and optical properties of various defects. Interpretation of the properties from the perspective of semiconductor physics and materials science and correlation of these defects to physical properties of the material. Experimental techniques including TEM, EBIC, CL, DLTS, etc. Recommended preparation: EMSE 426.
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3.00 Credits
Microcharacterization techniques of materials science and engineering: SPM (scanning probe microscopy), SEM (scanning electron microscopy), FIB (focused ion beam) techniques, SIMS (secondary ion mass spectrometry), EPMA (electron probe microanalysis), XPS (X-ray photoelectron spectrometry), and AES (Auger electron spectrometry), ESCA (electron spectrometry for chemical analysis). The course includes theory, application examples, and laboratory demonstrations.
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0.00 Credits
To provide teaching experience for all Ph.D.-bound graduate students. This will include preparing exam/quizzes/homework, leading recitation sessions, tutoring, providing laboratory assistance, and developing teaching aids that include both web-based and classroom materials. Graduate students will meet with supervising faculty member throughout the semester. Grading is pass/fail. Students must receive three passing grades and up to two assignments may be taken concurrently. Recommended preparation: Ph.D. student in Materials Science and Engineering.
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1.00 - 18.00 Credits
No course description available.
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1.00 - 18.00 Credits
No course description available.
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1.00 - 18.00 Credits
No course description available.
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