EMA 4501C - Scanning Electron Microscopy

Institution:

University of Central Florida

Subject:

Description:

Prerequisite(s): EGN 3365 or EMA 3706. A review of electron optics, beam/ specimen interactions, image formation, x-ray analysis, specimen preparation, microelectronic applications, and crystallography in the SEM. Occasional.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.ucf.edu/

Phone Number:

(407) 823-2000

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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