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Institution:
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New York University
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Subject:
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Description:
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Provides a working knowledge of and experience in scanning electron microscopy (SEM). Emphasis is on understanding the operation of the SEM (including routine maintenance), the design of the SEM, interaction of beam and specimen, a variety of specimen preparation techniques, photographic techniques for microscopy, and photographic procedures for presentation of data. A functional perspective of the ultrastructure as seen through the SEM is also studied.
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Credits:
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4.00
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Credit Hours:
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Prerequisites:
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Corequisites:
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Exclusions:
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Level:
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Instructional Type:
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Lecture
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Notes:
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Additional Information:
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Historical Version(s):
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Institution Website:
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Phone Number:
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(212) 998-1212
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Regional Accreditation:
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Middle States Association of Colleges and Schools
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Calendar System:
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Semester
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