2 830J - Control of Manufacturing Processes

Institution:

Massachusetts Institute of Technology

Subject:

Description:

Statistical modeling and control in manufacturing processes. Use of experimental design and response surface modeling to understand manufacturing process physics. Defect and parametric yield modeling and optimization. Forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.

Credits:

3.00

Credit Hours:

Prerequisites:

Prereq: 2.008, 6.041, 6.152, or 15.064

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

web.mit.edu/student/

Phone Number:

(617) 253-1000

Regional Accreditation:

New England Association of Schools and Colleges

Calendar System:

Four-one-four plan

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