2 131 - Advanced Instrumentation and Measurement

Institution:

Massachusetts Institute of Technology

Subject:

Description:

Provides training in advanced instrumentation and measurement techniques. Topics include system level design, fabrication and evaluation with emphasis on systems involving concepts and technology from mechanics, optics, electronics, chemistry and biology. Simulation, modeling and design software. Use of a wide range of instruments/techniques (e.g., scanning electron microscope, dynamic signal/system analyzer, impedance analyzer, laser interferometer) and fabrication/machining methods (e.g., laser micro-machining, stereo lithography, computer controlled turning and machining centers). Theory and practice of both linear and nonlinear system identification techniques. No final exam.

Credits:

3.00

Credit Hours:

Prerequisites:

Prereq: Permission of Instructor

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

web.mit.edu/student/

Phone Number:

(617) 253-1000

Regional Accreditation:

New England Association of Schools and Colleges

Calendar System:

Four-one-four plan

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