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Institution:
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Case Western Reserve University
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Subject:
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Description:
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Presentation of the main crystallographic defects in semiconductors; point defects (e.g., vacancies, interstitials, substitutional and interstitial impurities), line defects (e.g., dislocations), planar defects (e.g., grain boundaries). Structural, electrical and optical properties of various defects. Interpretation of the properties from the perspective of semiconductor physics and materials science and correlation of these defects to physical properties of the material. Experimental techniques including TEM, EBIC, CL, DLTS, etc. Recommended preparation: EMSE 426.
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Credits:
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3.00
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Credit Hours:
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Prerequisites:
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Corequisites:
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Exclusions:
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Level:
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Instructional Type:
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Lecture
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Notes:
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Additional Information:
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Historical Version(s):
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Institution Website:
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Phone Number:
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(216) 368-2000
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Regional Accreditation:
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North Central Association of Colleges and Schools
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Calendar System:
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Semester
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