MTSE 6620 - Advanced Electron & Ion Microscopy

Institution:

University of North Texas

Subject:

Materials Science&Engineering

Description:

6620. Advanced Electron & Ion Microscopy. 2 hours. The purpose of this class is to give students with existing electron and ion microscopy backgrounds the opportunity to gain theoretical and practical knowledge of advanced analytical techniques. Specific advanced topics include focused ion beam specimen preparation and patterning, Z-contrast scanning transmission electron microscopy, advanced diffraction and defect analysis, electron energy loss spectroscopy and energy filtered imaging in the transmission electron microscope, high resolution transmission electron microscopy imaging, and 3-D imaging of nanostructures using focused ion beam and tilt-series transmission electron microscopy. Specific applications of these techniques to modern problems in materials science will be stressed. Prerequisite(s): MTSE 6600 and MTSE 6605

Credits:

2.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.unt.edu

Phone Number:

(940) 565-2000

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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