ELEN 5397 - Fault Diagnos/Fault Toler Desg

Institution:

Lamar University

Subject:

Description:

Study of several test generation algorithms for combinational circuits such as Boolean Difference, D, PODEM, and FAN Algorithms. Test generation techniques for RAMS and microprocessors. Various methods for Design for testability and Fault Tolerant Design. Offered: Other

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.lamar.edu

Phone Number:

(409) 880-7011

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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