ELEN 5328 - VLSI Testing

Institution:

Lamar University

Subject:

Description:

Scaling induced testing challenge, fault modeling, controllability- observability measures, IDDQ testing, design for testability, built-in self testing, contactless testing, radiation effects, modeling and testing for single event effect, other signal integrity issues related to testing. Offered: Fall

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.lamar.edu

Phone Number:

(409) 880-7011

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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