ECE 5365 - Parametric Device Testing

Institution:

Texas Tech University

Subject:

Electrical Computer Engr

Description:

(3:3:0) Fundamentals of semiconductor device chip and wafer testing. Parametric and functional tests, test philosophy, C programming for testing, and commercial wafer level testers.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.ttu.edu

Phone Number:

(806) 742-2011

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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