EEE 239 - Advanced VLSI Design-For-Test II

Institution:

California State University-Sacramento

Subject:

Description:

Advanced topics in VLSI testing and Design-For-Test applications. Memory-specific test methodology and special features of memory designs employed in high volume manufacturing for improved testability, yield, and reliability. VLSI failure modes, their detection and prevention. Application of trim, redundancy, wear-leveling, and error correction. Prerequisite: EEE 238. Graded: Graded Student. Units: 3.0

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.csus.edu

Phone Number:

(916) 278-6011

Regional Accreditation:

Western Association of Schools and Colleges

Calendar System:

Semester

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