EEE 238 - Advanced VLSI Design-For-Test I

Institution:

California State University-Sacramento

Subject:

Description:

Focus on integrated circuit design-for-test-techniques; semiconductor reliablity factors and screening; semiconductor fabrication processes, device physics and related performance limitations; quantifying cost/quality tradeoffs; IC manufacturing flows and high-accuracy parametric test methods. Prerequisite: CPE 151 and CPE 166. Graded: Graded Student. Units: 3.0

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.csus.edu

Phone Number:

(916) 278-6011

Regional Accreditation:

Western Association of Schools and Colleges

Calendar System:

Semester

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