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Institution:
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University of Notre Dame
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Subject:
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Electrical Engineering
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Description:
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This course treats the optical characterization techniques that are employed to inestigate the physical properties of modern semiconducting materials. A brief overview will first be given of the basic science and growth of these maerials, and the theory for their optical characterization. A detailed description will then be provided of measurement techniques such as reflectance and modulaiton specroscopy, photoluminescense, time-resolved spectroscopy, infrared absorption, Raman and Brillouin scattering. These fundamentals will be illustrated by examples in current semiconductor research and technology. Optical processes in semiconductors like inter and intra-band absorption, imurity effects, electro-optical and polarization effects, excitons and theiry dynamics will be addressed. Emphasis will be gien to the use of these techniques to invetigate low dimensional nanostructures such as quantum wells, wires, and dots.
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Credits:
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3.00
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Credit Hours:
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Prerequisites:
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Corequisites:
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Exclusions:
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Level:
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Instructional Type:
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Lecture
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Notes:
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Additional Information:
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Historical Version(s):
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Institution Website:
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Phone Number:
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(574) 631-5000
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Regional Accreditation:
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North Central Association of Colleges and Schools
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Calendar System:
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Semester
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