GEOL G425 - Scanning Electron Microscopy

Institution:

Indiana University-Fort Wayne

Subject:

Description:

Theory and practice of scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX). Some discussion of wavelength dispersive methods. Preparation for Course P: G221 or consent of instructor. Cr. 2-3. Notes If you are majoring in this discipline, you may want to consider the Science and Engineering Research Semester. See information under Arts and Sciences (Part 3).

Credits:

2.00 - 3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.ipfw.edu

Phone Number:

(260) 481-6100

Regional Accreditation:

North Central Association of Colleges and Schools

Calendar System:

Semester

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