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Institution:
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University of Connecticut-Avery Point
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Subject:
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Description:
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(261) Either semester. Three credits. Prerequisite: MSE 2002. Introduces materials characterization and applications at the nanoscale. Standard and advanced methods in Scanning Probe Microscopy, Electron Microscopy, and Focused Ion Beams are presented. Self-Assembled and Lithographically defined structures are treated. Nanoscale particles, tubes, films, and structures are discussed. Applications for enhanced mechanical, electronic, magnetic, optical, and biological properties are described. Societal implications including performance, costs, environmental impacts, and health issues are addressed. Readings from modern scientific literature are assigned weekly for in-class discussions.
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Credits:
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3.00
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Credit Hours:
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Prerequisites:
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Corequisites:
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Exclusions:
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Level:
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Instructional Type:
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Lecture
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Notes:
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Additional Information:
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Historical Version(s):
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Institution Website:
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Phone Number:
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(860) 486-2000
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Regional Accreditation:
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New England Association of Schools and Colleges
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Calendar System:
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Semester
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