ECE U528 - CAD for Design and Test

Institution:

Northeastern University

Subject:

Description:

Addresses the principles of the algorithms and approaches for VLSI design and test automation. Briefly covers basic data structures and graph algorithms typically used for computer-aided design (CAD) as well as general-purpose methods for combinatorial optimization, such as backtracking, branch-and-bound, simulated annealing, and genetic algorithms. Design automation topics include physical design automation (partitioning, floor planning, placement, global and detailed routing, cell generation, and layout compaction), and high-level synthesis (scheduling, resource allocation). Testing topics include an overview of fault modeling, automatic test pattern generation, design for testability, and built-in self test (BIST). Course involves some programming assignments (implementation of some of the algorithms covered in class) as well as using state-of-the-art CAD tools in the design flow.

Credits:

4.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.northeastern.edu

Phone Number:

(617) 373-2000

Regional Accreditation:

New England Association of Schools and Colleges

Calendar System:

Semester

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