MSE 161 - Analytical Materials Characterization

Institution:

University of California-Riverside

Subject:

Description:

Lecture, 3 hours; laboratory, 3 hours. Prerequisite(s): MSE 160. Analysis of the surfaces of materials via ion, electron, and photon spectroscopies. Includes Rutherford back scattering; secondary ion mass spectroscopy; electron energy loss spectroscopy; Auger electron spectroscopy; X-ray photoelectron spectroscopy; photoluminescence; extended X-ray absorption fine structure; Fourier transfrom infrared spectroscopy; and Raman spectroscopy. Also covers sputtering, high-vacuum generation, and focused ion beam milling.

Credits:

4.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

WWW.UCR.EDU

Phone Number:

(951) 827-1012

Regional Accreditation:

Western Association of Schools and Colleges

Calendar System:

Quarter

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