GEOL 396 - X-ray Characterization of Solid Materials

Institution:

James Madison University

Subject:

Description:

3 credits. Offered spring every other year. Covers fundamental principles and theory behind two powerful, X-ray based, technologies: X-ray Diffraction and Energy Dispersive Analysis of X-rays (EDS). Students will collect and analyze data from a single crystal Gandolfi X-ray camera, automated powder diffraction system (focusing goniometer), and EDAX system (EDS). Prerequisite: GEOL 280, MATS/CHEM/PHYS 275 or ISAT 300.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.jmu.edu/

Phone Number:

(540) 568-6211

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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