MTLE 6080 - Electron Microscopy of Materials

Institution:

Rensselaer Polytechnic Institute

Subject:

Description:

Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction. Prerequisites/Corequisites: Prerequisite: MTLE 2100 or MTLE 6040. When Offered: Fall term. Credit Hours: 3

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.rpi.edu

Phone Number:

(518) 276-6000

Regional Accreditation:

Middle States Association of Colleges and Schools

Calendar System:

Semester

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