EE 720 - Designing for Testability

Institution:

Capitol Technology University

Subject:

Description:

Design for testability. Types of testing, functional testing, and structural testing. Automatic test pattern generation. Scanning and scan based design rules. Critical paths. Memory test and diagnostics. Builtin self-testing. ATE equipment, local and remote testing and limitations. Students will have access to on-line test workstations. Normally offered during summer semester. Prerequisite: graduate status.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.capitol-college.edu

Phone Number:

(301) 369-2800

Regional Accreditation:

Middle States Association of Colleges and Schools

Calendar System:

Semester

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