CPE 431 - Digital System Testing and Design for Testability

Institution:

Jackson State University

Subject:

Description:

Prerequisites: CPE 330 and EN 212. This course introduces fundamental techniques for detecting defects in VLSI circuits. Topics include fault models, fault detection, and schemes for designing systems to be easily testable and with self-test capability.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.jsums.edu

Phone Number:

(601) 979-2121

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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