CBEMS 164 - X-Ray Diffraction, Electron Microscopy, and Microanalysis

Institution:

University of California-Irvine

Subject:

Description:

Material characterization using x-ray diffraction and scanning electron microscopy (SEM). Topics include x-ray diffraction and analysis; SEM imaging and microanalysis. Prerequisite: ENGR54. (Design units: 1)

Credits:

4.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.uci.edu/

Phone Number:

(949) 824-5011

Regional Accreditation:

Western Association of Schools and Colleges

Calendar System:

Quarter

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