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Institution:
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New York Institute of Technology
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Subject:
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Description:
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The applied techniques for determining the quality of massproduced items by means of statistical analysis. The use of control charts for detecting changes in a process. Setting control limits and lot sizes for sampling inspection plans. Sampling by variables and attributes. Prediction of the probable percentage defective in a monitored process. (Offered regularly, but not every semester.) Prerequisite: TMAT 135.
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Credits:
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3.00
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Credit Hours:
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Prerequisites:
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Corequisites:
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Exclusions:
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Level:
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Instructional Type:
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Lecture
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Notes:
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Additional Information:
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Historical Version(s):
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Institution Website:
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Phone Number:
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(516) 686-7516
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Regional Accreditation:
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Middle States Association of Colleges and Schools
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Calendar System:
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Semester
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