ELET 285 - Semiconductor Metrology And Process Control

Institution:

Hudson Valley Community College

Subject:

Description:

Spring Lab fee will be required. This course introduces the student to concepts employed in industries in the analysis of semiconductor materials, products, processes and systems. The course provides modules on process flowcharting, process parameters, semiconductor metrology instruments, interpreting measurement data, statistical analysis of process data, design of experiments, and applying team troubleshooting skills in solving process problems. The course will allow the student to develop an understanding of physical measurement in conjunction with the statistical data analysis and process experiment design. Prerequisite: MATH 151, Analytical Geometry and Basic Calculus.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Multiple

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.hvcc.edu

Phone Number:

(518) 629-4822

Regional Accreditation:

Middle States Association of Colleges and Schools

Calendar System:

Semester

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