ELEC 571 - Imaging At The Nanoscale

Institution:

Rice University

Subject:

Description:

A survey of the techniques used in imaging submicron and nanometer structures with an emphasis on applications in chemistry, physics, biology, and materials science. The course includes an introduction to scanning probe microscopy and single photon counting including STM, AFM, NSOM, and confocal microscopy, as well as discussions on the fundamental and practical aspects of image acquisition, analysis, and artifacts.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.rice.edu

Phone Number:

(713) 348-0000

Regional Accreditation:

Southern Association of Colleges and Schools

Calendar System:

Semester

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