MS 142 - Application of Diffraction Techniques in Materials Science

Institution:

California Institute of Technology

Subject:

Materials Science

Description:

Applications of X-ray and neutron diffraction methods to the structural characterization of materials. Emphasis is on the analysis of polycrystalline materials but some discussion of single crystal methods is also presented. Techniques include quantitative phase analysis, crystalline size measurement, lattice parameter refinement, internal stress measurement, quantification of preferred orientation (texture) in materials, Rietveld refinement, and determination of structural features from small angle scattering. Homework assignments will focus on analysis of diffraction data. Samples of interest to students for their thesis research may be examined where appropriate. Not offered 2012–13.

Credits:

9.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Multiple

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.caltech.edu

Phone Number:

(626) 395-6811

Regional Accreditation:

Western Association of Schools and Colleges

Calendar System:

Quarter

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